VeTek Semiconductor offers a comprehensive set of component solutions for LPE silicon epitaxy reaction chambers, delivering long lifespan, stable quality, and improved epitaxial layer yield. Our product such as SiC Coated Barrel Susceptor received position feedback from customers. We also provide technical support for Si Epi, SiC Epi, MOCVD, UV-LED Epitaxy, and more. Feel free to inquire for pricing information.
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LPE (Liquid Phase Epitaxy) silicon epitaxy is a commonly used semiconductor epitaxial growth technique for depositing thin layers of single-crystal silicon on silicon substrates. It is a liquid-phase growth method based on chemical reactions in a solution to achieve crystal growth.
The basic principle of LPE silicon epitaxy involves immersing the substrate into a solution containing the desired material, controlling temperature and solution composition, allowing the material in the solution to grow as a single-crystal silicon layer on the substrate surface. By adjusting the growth conditions and solution composition during epitaxial growth, desired crystal quality, thickness, and doping concentration can be achieved.
LPE silicon epitaxy offers several characteristics and advantages. Firstly, it can be performed at relatively low temperatures, reducing thermal stress and impurity diffusion in the material. Secondly, LPE silicon epitaxy provides high uniformity and excellent crystal quality, suitable for manufacturing high-performance semiconductor devices. Additionally, LPE technology enables the growth of complex structures, such as multilayer and heterostructures.
In LPE silicon epitaxy, the SiC Coated Barrel Susceptor is a crucial epitaxial component. It is typically used to hold and support the silicon substrates required for epitaxial growth while providing temperature and atmosphere control. The SiC coating enhances the high-temperature durability and chemical stability of the susceptor, meeting the requirements of the epitaxial growth process. By utilizing the SiC Coated Barrel Susceptor, the efficiency and consistency of epitaxial growth can be improved, ensuring the growth of high-quality epitaxial layers.
Basic physical properties of CVD SiC coating |
|
Property | Typical Value |
Crystal Structure | FCC β phase polycrystalline, mainly (111) oriented |
SiC coating Density | 3.21 g/cm³ |
CVD SiC coating Hardness | 2500 Vickers hardness(500g load) |
Grain SiZe | 2~10μm |
Chemical Purity | 99.99995% |
Heat Capacity | 640 J·kg-1·K-1 |
Sublimation Temperature | 2700℃ |
Flexural Strength | 415 MPa RT 4-point |
Young' s Modulus | 430 Gpa 4pt bend, 1300℃ |
Thermal Conductivity | 300W·m-1·K-1 |
Thermal Expansion(CTE) | 4.5×10-6K-1 |